Getting Copies of these Papers:
Subscribers to this Transactions (and subscribers to XPLORE/IEL/MDL) may freely
download the PDFs of any of these papers, at the XPLORE On-Line Library.
Guests may access abstract/citation records free of charge.
IEEE Transactions on Components, Packaging, and Manufacturing Technology Part A:
Components and Packaging Technologies
DECEMBER 1996, Volume 19, Issue 4
CONTRIBUTIONS FROM THE 12th SEMITHERM SYMPOSIUM
- FOREWORD
- V.
P. Manno, R. E. Simon, and T. S. Tarter
[p. 449]
- Thermal Performance of an MCM Flip-Chip Assembly in Liquid
Nitrogen
- R. K. Ulrich and S.
Rajan
[p. 451]
- Analysis of Thermally Enhanced SOIC
Packages
- B. M. Guenin, A. R. Chowdhury, R. L.
Groover, and E. J. Derian
[p. 458]
- Thermal Evaluation of a PowerPC 620 Multiprocessor in a
Multiprocessor
Computer
- H.
Wong and T.-Y. T. Lee
[p. 469]
- Development of JEDEC Standard Thermal Measurement Test
Boards
- D.
Edwards
[p. 478]
- Design and Optimization of Pin Fin Heat Sinks for Low
Velocity
Applications
- H.
Shaukatullah, W. R. Storr, B. J. Hansen, and M. A.
Gaynes
[p. 486]
- Design Considerations for Air Cooling Electronic Systems
in High Altitude Conditions
- C. L.
Belady
[p. 495]
- Three-Dimensional
Thermal Modeling Based on the Two-Port Network Theory for Hybrid or
Monolithic Integrated Power
Circuits
- J.-M. Dorkel, P. Tounsi, and
P. Leturcq
[p. 501]
REGULAR PAPERS
- Improving the Frequency
Response of Ceramic Dielectrics for High Power
Applications in Power Electronic
Converters
- C. K. Campbell, J. D. van
Wyk, and M. F. K. Holm
[p. 508]
- Wafer Through-Hole Interconnections with High Vertical
Wiring
Densities
- C.
Christensen, P. Kersten, S. Henke, and S.
Bouwstra
[p. 516]
- Development of Modular
Products
- A. Kusiak and C.-C.
Huang
[p. 523]
- A Closed Form Solution of Junction to Substrate Thermal
Resistance in
Semiconductor Chips
- F. N.
Masana
[p. 539]
- Mechanism of Electrical Conduction Through Anisotropically
Conductive
Adhesive
Films
- M.
Mizuno, M. Saka, and H.
Abé
[p. 546]
- Laser Linking of Metal Interconnect: Linking Dynamics and
Failure
Analysis
- R. L. Rasera and J. B.
Bernstein
[p. 554]
- In-Process Board Warpage Measurement in a Lab Scale Wave
Soldering Oven
- M. R. Stiteler, I. C. Ume, and B.
Leutz
[p. 562]
OPEN FORUM
- EDITORIAL
- M.
Pecht
[p. 570]
ANNOUNCEMENTS
- Associate Editors
- A.
Bar-Cohen
[p. 574]
- Papers Submitted for
Publication
- [p. 577]
- 1996 INDEX
- Follows
page
[p. 577]
Return to CPMT Transactions' Tables of Contents