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IEEE Transactions on Components, Packaging, and Manufacturing Technology Part B:
Advanced Packaging
May 1996, Volume 19, Issue 2
CONTRIBUTIONS FROM THE THIRD TOPICAL MEETING ON THE
ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING
-
FOREWORD
-
J.
L. Prince
-
Estimating Crosstalk in Multiconductor
Transmission
Lines
-
C.
Gordon and K. M. Roselle
-
Millimeter-Wave Monolithic
Integrated Circuit Interconnects Using
Electromagnetic Field
Coupling
-
G. Strauss and W. S.
Menzel
-
Efficient Reduced-Order Modeling of
Frequency-Dependent Coupling
Inductances Associated with 3-D Interconnect
Structures
-
L. M. Silveira, M. Kamon, and J.
White
-
A New Algorithm for
Experimental Circuit Modeling of Interconnection
Structures Based on
Causality
-
S. Sercu and L.
Martens
CONTRIBUTIONS FROM THE 45th ELECTRONIC COMPONENTS AND MANUFACTURING TECHNOLOGY CONFERENCE (ECTC)
-
Importance of Molding Compound Chemical Shrinkage in the
Stress and
Warpage Analysis of
PQFP's
-
G.
Kelly, C. Lyden, W. Lawton, J. Barrett, A. Saboui, H. Pape, and H.
Peters
-
Effect of Adhesive Surface
Chemistry and Morphology on Package Cracking
in Tapeless Lead-On-Chip (LOC)
Packages
-
M.
Amagai
-
Improved Yield and Performance of Ball-Grid Array
Packages: Design and
Processing Guidelines for Uniform and Nonuniform
Arrays
-
S. M. Heinrich, S. Shakya, Y.
Wang, P. S. Lee, and S. A. Schroeder
-
Effect of PCB Finish on the Reliability and Wettability of
Ball Grid
Array Packages
-
E. Bradley and K.
Banerji
REGULAR PAPERS
- Electrical Modeling and Measurement
-
Broadband Characterization of Low Dielectric Constant
and Low Dielectric
Loss
CYTUF$^{{\rm{TM}}}$ Cyanate Ester
Printed Circuit Board
Material
-
A.
Deutsch, C. W. Surovic, A. P. Lanzetta, H. A. Ainspan,
J.-C. Abbiate, A. Viehbeck, J. C. Hedrick, J. M. Shaw, S. L. Tisdale,
E. F. Foster, and P. W.
Coteus
-
An Experimental Technique for Full Package Inductance
Matrix
Characterization
-
C.-T.
Tsai and W.-Y. Yip
-
Accurate Simultaneous Switching Noise Estimation Including
Velocity-Saturation
Effects
-
S. R.
Vemuru
-
Noise Computation in Single Chip
Packages
-
K.
Bathey, M. Swaminathan, L. D. Smith, and T. J.
Cockerill
-
Ground Noise Minimization in
Integrated Circuit Packages through Pin
Assignment Optimization
-
J. M. Williamson, M.
S. Nakhla,
Q.-J. Zhang, and P. D. van der Puije
-
Guidelines for High-Performance Electronic Package
Interconnections---Approach for Strong
Coupling
-
Y.
Yang and J. R. Brews
-
Electrical Performance of Interconnects in
Polyimide–Copper Thin
Film Multilayers on Ceramic
Substrate
-
M.
Bedouani, D. Lambert, and K. Kurzweil
- MCM and PCB Design and Fabrication
-
Limitation of the Signal Pin Density on Wiring
Boards
-
T.
Chiba, M. Yamada, and F. Kobayashi
-
Flat Spiral Delay Line Design with Minimum Crosstalk
Penalty
-
R.-B.
Wu and F.-L. Chao
-
A Chips-First Multichip Module Implementation of
Passive and Active Test
Coupons Utilizing Texas Instruments' High Density Interconnect
Technology
-
T. M. Schaefer, J. J. Kacines,
B. A. Randall, L. E.
Roszel, G. J. Fokken, D. Walter,
D. J. Schwab, L. Mowatt, and B. K.
Gilbert
-
Adhesion Enhancement and Lamination of Polyimide
Films
-
N. C. Stoffel, M. Hsieh, E. J. Kramer,
and W. Volksen
-
Effect of Surface Energies on Screen Printing
Resolution
-
T.-X. Liang, W. Z. Sun, L.-D. Wang, Y.
H. Wang, and H.-D. Li
- Thermal and Cooling Analysis
-
Thermal Performance Comparison of High Pin Count Cavity-Up
Enhanced
Plastic Ball Grid Array (EPBGA)
Packages
-
A.
Mertol
-
A Very High Heat Flux Microchannel Heat Exchanger for
Cooling of
Semiconductor Laser Diode
Arrays
-
S.
K. Roy and B. L. Avanic
ANNOUNCEMENTS
-
List of
Reviewers
-
Call for Papers: 5th Topical Meeting on the Electrical
Performance of Electronic
Packaging
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