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IEEE Transactions on Components, Packaging, and Manufacturing Technology Part B: Advanced Packaging

August 1997, Volume 20, Number 03


Editorial
P. J. Krusius

[p. 190]


REGULAR PAPERS

VCSEL Electrical Packaging Analysis and Design Guidelines for Multi-GHz Applications
S. H. Hall, W. L. Walters, L. F. Mattson, G. J. Fokken, and B. K. Gilbert

[p. 191]

S Parameter-Based Experimental Modeling of High Q MCM Inductor with Exponential Gradient Learning Algorithm
J. Zhao, R. C. Frye, W. W.-M. Dai, and K. L. Tai

[p. 202]

Wetting Interactions Between the Ni-Cu-P Deposit and In-Sn Solders
C.-J. Chen and K.-L. Lin

[p. 211]

Impedance and Crosstalk of Stripline and Microstrip Transmission Lines
A. J. Rainal

[p. 217]

Highly Efficient Coupling Between Single-Mode Fiber and Polymer Optical Waveguides
T. S. Barry, D. L. Rode, and R. R. Krchnavek

[p. 225]

Criteria for the Assessment of Reliability Models
M. G. Pecht, A. A. Shukla, N. Kelkar, and J. Pecht

[p. 229]

Fast Parameter Extraction for Multiconductor Interconnects in Multilayered Dielectric Media Using Mixture Method of Equivalent Source and Measured Equation of Invariance
R. Jin, Y. Cao, and Z. Li

[p. 235]

Excimer Laser Machining and Metallization of Vias in Aluminum Nitride
J. K. Lumpp and S. D. Allen

[p. 241]

Residual Stresses in Plastic IC Packages During Surface Mounting Process Preceded by Moisture Soaking Test
S. Yi, J. S. Goh, and J. C. Yang

[p. 247]

Low-Cost Fabrication of Optical Subassemblies
M. S. Cohen, G. W. Johnson, J. M. Trewhella, D. L. Lacey, M. M. Oprysko, D. L. Karst, S. M. DeFoster, W. K. Hogan, M. D. Peterson, and J. A. Weirick

[p. 256]


CONTRIBUTIONS from the 5TH Topical Meeting on Electrical Performance of Electronic Packaging

Foreword
J. L. Prince and A. Deutsch

[p. 264]

Measurement, Modeling, and Simulation of Flip-Chip CMOS ASIC Simultaneous Switching Noise on a Multilayer Ceramic BGA
J. P. Libous and D. P. O'Connor

[p. 266]

Power Distribution Fidelity of Wirebond Compared to Flip Chip Devices in Grid Array Packages
H. Hashemi and D. J. Herrell

[p. 272]

High Density Packaging of X-Band Active Array Modules
M. S. Hauhe and J. J. Wooldridge

[p. 279]

SSO Noise Electrical Performance Limitations for PQFP Packages
L. Lin and J. L. Prince

[p. 292]


CONTRIBUTIONS from the International Conference on Innovative Systems in Silicon (ISIS '96)

Foreword
D. Sciuto, S. K. Tewksbury, and G. H. Chapman

[p. 298]

Testability and Signal Integrity in a Low Cost Multichip Module
A. Omer and A. Flint

[p. 300]

Early Analysis of Cost/Performance Trade-Offs in MCM Systems
V. Garg, D. J. Stogner, C. Ulmer, D. E. Schimmel, C. Dislis, S. Yalamanchili, and D. S. Wills

[p. 308]

Cost-Effective Multichip Module Manufacture Using Passive Substrate Fault Tolerance
C. Peacock, H. Bolouri, and C. Habiger

[p. 320]

Versatile Multilayer MCM-D Structure for High Reliability Applications
J. Strandberg, H. Thiede, A. Karlsson, P. Bodö, J. Haglund, S. Valizadeh, and A. Weiland

[p. 327]

Performance Analysis of MCM Systems
C. Truzzi, E. Beyne, and E. Ringoot

[p. 334]

Effects of Scanning and Biasing Circuit Restructuring on the Response of a Large Area Magnetic Field Sensor Array
Y. Audet and G. H. Chapman

[p. 342]


ANNOUNCEMENTS

Call for Papers--48th Electronic Components and Technology Conference (ECTC '98)
[p. 349]


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