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IEEE Transactions on
Electronics Packaging Manufacturing
A PUBLICATION OF THE IEEE COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY SOCIETY
January 1999, Volume 22, Number 01
- Editorial
- W.
J. Trybula
[p. 1]
- Abstracts
[p. 3]
CONTRIBUTIONS FROM THE 1998 INTERNATIONAL CONFERENCE ON MULTICHIP MODULES AND HIGH DENSITY PACKAGING
- Foreword
- R.
W. Johnson
[p. 6]
- Thermosonic Gold Wire Bonding to Laminate Substrates
with Palladium Surface
Finishes
- R.
W. Johnson
- ,
M. J. Palmer, M. J.
Bozack, and T. Isaacs-Smith
[p. 7]
- Evaluation of Diffusion Patterning as an Alternative
Substrate Technology for Automotive
Applications
- J.
Xue, T. L. Baker, T. Klosowiak, M. Molnar, M. Pomeroy, J. Weimer, G.
Bianco, and R. Mason
[p. 16]
- The Flip-Chip Bump Interconnection for
Millimeter-Wave GaAs
MMIC
- H.
Kusamitsu, Y. Morishita, K. Maruhashi, M. Ito, and K.
Ohata
[p. 23]
- Yield Prediction for Flip-Chip Solder Assemblies
Based on Solder Shape
Modeling
- S. C. Tower, B. Su, and Y. C.
Lee
[p. 29]
- In-Situ
Stress State Measurements During Chip-on-Board
Assembly- Y.
Zou, J. C. Suhling, R. W. Johnson, R. C. Jaeger, and A. K. M.
Mian
[p. 38]
REGULAR PAPERS
- Correlation of Flip Chip Underfill Process Parameters
and Material Properties with In-Process Stress
Generation
- P. Palaniappan, D. F.
Baldwin, P. J. Selman, J. Wu, and C. P. Wong
[p. 53]
- Development of Real Time/Variable
Sensitivity Warpage Measurement Technique and its Application to Plastic
Ball Grid Array Package
- K. Verma, D. Columbus, and B.
Han
[p. 63]
- The Deformation Behavior of Sn62Pb36Ag2 and Its
Implications on the Design of Thermal Cycling Tests for Electronic
Assemblies
- G.
Grossmann
[p. 71]
- Conductive Filament Formation: A Potential
Reliability Issue in Laminated Printed Circuit Cards with Hollow
Fibers
- M. Pecht, C. Hillman,
K. Rogers, and D. Jennings
[p. 80]
- A Component-Based Software Architecture for
Robotic Workcell
Applications
- J. M. Reagin, J. E.
Beck, T. E. Sweeny, R. L. Anderson, and T. D.
Garner
[p. 85]
IEEE Copyright
Form
[p. 95]
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