An IEEE Professional Development Course in San Francisco

"How to Make a Photonic Device Into a Product: Role of Accelerated Life Testing"
with Dr. Ephriam Suhir, University of Illinois at Chicago and ERS Co.

Photonics Packaging Week at WESCON -- August 10 - 14, 2003
Sunday August 10	Monday August 11	Tuesday August 12	Wednesday August 13	Thursday August 14
PhoPack Short Courses: Full-day Course:     "Photonics Packaging: Assy & Test" AM Course:     "Photonic Device Accel Life Testing" PM Course:     "Modeling/Sim for Photonics Pkgng"	PhoPack Sessions (Day 1)	PhoPack Sessions (Day 2)	PhoMat Short Courses: AM Courses (choose one):     "Photonics Devices: Mtls, Dsgn and Rel"    "Emerging Tech for Opto Pkgng/Assy"    "Adhesively Bonded Joints in Opto" PM Courses (choose one):     "Designing MEMS for Reliability"     "Interface Adhesion & Fracture in Electr Pkgng"     "Fiber-Optics Structures: Design for Rel"	PhoMat Sessions
Register for both PhoPack and PhoMat -- take advantage of the joint-registration discount
Free admission to all the WESCON exhibits -- included in your Symposium or Short Course registration!

OUTLINE:
This course describes various aspects of accelerated life testing (ALT) and highly accelerated life testing (HALT) in photonic engineering: their role, objectives, attributes, challenges, methodologies, and pitfalls. It addresses both technical and business related aspects of the ALT and HALT, as well as their interaction with qualification testing and product development testing. Particular attention is dedicated to the ALT/HALT models, both analytical and computer-aided. The case of a solder assembly is used to illustrate the discussed concepts and approaches.

WHO SHOULD ATTEND:
The course is intended for engineers, researchers, technical managers, as well as for business and market oriented specialists. No special background is required to comprehend the course content.

OUTLINE:

The course will enable participants to
• Compare the role and objectives of, and the challenges in, accelerated life tests (ALT) with other types of accelerated tests, such as qualification tests and product development tests
• Compare the requirements for, and the role of, accelerated life tests and highly accelerated life tests (HALT)
• Establish the role that ALT and HALT can and should play in making a photonic device a product
• Define which ALT category is most suitable for determining particular (anticipated) modes and mechanisms of failure
• Adequately design the ALTs, HALTs and some ultra ("super") HALTs that are able to reduce dramatically the time required for obtaining information on the modes and mechanisms of failure
• Compute the probability of failure for a particular device operated at the given conditions for the given duration of time
• Explain the role of predictive modeling in the design of the ALTs, as well as in the analysis and interpretation of the ALT data
• Identify and establish the adequate interaction of the qualification tests and ALTs for a particular photonics product design, and to make a particular device a marketable product

ABOUT THE INSTRUCTOR:
Dr. Ephraim Suhir is Distinguished Member of Technical Staff (ret.), Bell Laboratories, Basic Research Area, Physical Sciences and Engineering Research Division. He is currently with the University of Illinois, Chicago, IL. Dr. Suhir is Fellow of the American Physical Society (APS), Institute of Electrical and Electronics Engineers (IEEE), American Society of Mechanical Engineers (ASME) and the SPE (Society of Plastics Engineers). He is co-founder and technical editor of the ASME Journal of Electronic Packaging. Dr. Suhir has authored numerous technical publications (papers, book chapters, books, patents), including monographs "Structural Analysis of Microelectronic and Fiber Optic Systems", Van-Nostrand, 1991 and "Applied Probability for Engineers and Scientists", McGraw-Hill, 1997. Dr. Suhir is member of the IEEE Technical Advisory Board (TAB), Distinguished Lecturer of the IEEE CPMT (Components, Packaging and Manufacturing Technologies) Society and Member of the Board of Governors of this Society. He is also Member-at-Large of the IEEE Technical Advisory Board. Dr. Suhir received many distinguished service and professional awards, including: 2001 IMAPS John A. Wagnon Technical Achievement Award, 2000 IEEE Outstanding Sustained Technical Contribution Award, 2000 SPE Fred O. Conley Award, and 1999 ASME and Pi-Tau-Sigma Charles Russ Richards Memorial Award. Dr. Suhir presented numerous invited and keynote talks in universities and at professional conferences worldwide, and taught many professional development and university courses on various topics of materials, reliability and mechanical problems in micro-, opto-electronics and other areas of engineering and applied science.

TO REGISTER:

• You may download, print and mail/FAX the registration form for PhoPack, PhoMat, and Professional Development Courses (300kB PDF).

• You may use the internet to register on-line. Note that there is a second registration page for additional free WESCON events.

• We reserve the right to cancel those Professional Development courses with inadequate registration; you will be advised by August 5th, and be allowed to switch your registration to an alternate program or get a full refund.

• Professional Development Course Organizer: Dr. Allen Earman.