An IEEE Professional Development Course in San Francisco
"Designing MEMS for Reliability"
with Dr. Arman Gasparyan, Dr. Susanne Arney, and Dr. Herbert Shea, all of Lucent Technologies, Murray Hill, NJ
DATE & TIME:
Wednesday, August 13, 2003
This course has been cancelled; please select one of the remaining courses
COST:
IEEE Members: $150; Non-Members: $175
$50 discount when registering for an AM and a PM course
Includes class handouts and refreshments
You can also register for an AM Course
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Dr. Suzanne Arney, Member of the Technical Staff
(MTS), Microstructure Physics Research; Micro-electro-mechanical systems
(MEMS) and surface and bulk micromachining.
Research Interest: MEMS Reliability--bridging the gap between MEMS research concepts and commercialization through sequential identification, accelerated lifetime testing, and elimination of MEMS-specific chip-level and package-level failure modes. Design for Reliability of MEMS enabling optical, rf, acoustic, and physics applications in telecommunications.
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LOCATION:
Moscone Convention Center, San Francisco
in association with PhoPack and PhoMat --
held jointly with the IEEE WESCON Exhibition.
OUTLINE:
This course provides attendees with a basic working knowledge of how to design MEMS for reliability. The course concentrates on MEMS design, reliability physics, MEMS-specific fundamental reliability phenomena and failure modes, and accelerated testing protocols. Practical and useful examples from various arenas of MEMS applications are provided.
WHO SHOULD ATTEND:
This course is intended for managers, scientists, engineers, and graduate students to learn how to design Anyone who needs to learn how to design reliable MEMS. This course will be of value to those who either design their own MEMS or those who work directly or indirectly with MEMS designers. MEMS Materials, Fabrication, Packaging, Design, Reliability and Test engineers will benefit from this overview of MEMS Reliability physics.
LEARNING OUTCOMES:
This course will enable you to:
- develop a design-for-reliability mentality
- become fluent with the many aspects of MEMS reliability physics and failure mechanisms
- learn how to efficiently construct a MEMS reliability test plan to expand beyond qualification-based knowledge
- evaluate specific MEMS designs for reliability investigations
- understand the importance of fundamental models of MEMS failure mechanisms in designing accelerated testing strategies
- assess reliability test results to obtain truly robust MEMS designs.
ABOUT THE INSTRUCTORS:
Dr. Arman Gasparyan has done pioneering fundamental physics-based MEMS Reliability research in the Bell Laboratories, Lucent Technologies MEMS Reliability Research group. His specialty is non-invasive characterization of optical, mechanical and electrical aspects of MEMS reliability physics.
Dr. Susanne Arney has been involved in MEMS component design, fabrication, and reliability for over 15 years. As Director of Microsystems Research, she heads the Micromechanics Research Department at Bell Laboratories, Lucent Technologies in Murray Hill, New Jersey.
Dr. Herbert Shea heads the MEMS Reliability Research group at Bell Laboratories, Lucent Technologies, with Reliability responsibility for commercialization of optical MEMS.
TO REGISTER:
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Paul Wesling.