An IEEE Short Course in the S. F. Bay Area

Title:
"UNDERSTANDING IMAGING AND ANALYSIS OF THIN FILMS AND CONTAMINATION"
with Rob Piercy, Foothills Analytical Laboratory

Please Post and Circulate, through September 26.

About This Short Course series
Course Overview
About the Instructor
How to Register

LOCATION:
UC Extension, 1180 Bordeaux Drive, Sunnyvale, near Highway 237 & Mathilda
Print out the map to the UCSC site.

SPONSOR:
The Institute of Electrical and Electronics Engineers: the Components, Packaging, and Manufacturing Technology Society Chapter.

COST:
IEEE Members: $225; Non-Members: $249
includes class handbook, lunch and refreshments.

INFORMATION:
Contact Dr. Bob Dubin (650) 592-0315 or Dr. John Newman (408) 978-1069 (FAX# 408-978-1069)

OVERVIEW:
A variety of practical methods used to examine, image, and analyze surfaces found in disk drive and semiconductor applications are described in an easy to understand, non-mathematical way. Strengths and weaknesses are explored along with an explanation of how, why, and where these techniques work best. Emphasis is placed on determining the "best fit" analytical method for selected applications, potential analysis pitfalls, and understanding types of errors that commonly arise when interpreting complex analytical data. A few real-life detective stories and some practical examples taken from actual applications are included to enhance understanding.

WHO SHOULD ATTEND:
Those working in failure analysis, device qualification, quality assurance, manufacturing and process engineering, commodity engineering, and reliability. Individuals who want to broaden their practical knowledge and understanding of materials analysis techniques.

TOPICS:

• Popular Techniques: How and Why They Work
  • SEM, SPM(s), TEM, EDX, XRF, ESCA, Auger, SIMS, FTIR, LRS and others
• Light, Electron, and Mechanical Imaging of Surface Topography
  • Applications, Limitations, Pitfalls
• Chemical Analysis Techniques for Surfaces and Debris
  • Applications, Limitations, Sample Handling, Sample Preparation and Problems
• Understanding and Interpreting Results
  • A discussion of "real life examples"

ABOUT THE INSTRUCTOR:
Rob Piercy holds a B.A.Sc in Materials Science from the University of Toronto and an M.S. degree in Materials Science from Purdue. He formed Foothills Analytical Laboratory in 1991 and provides materials analysis and consulting services to semiconductor and disk drive companies.

HOW TO REGISTER:

         FEES:      IEEE Members:         $225  
                    other attendees:      $249
  Checks or P.O.s should be made payable to "IEEE/CPMT"
  and sent with this registration form to:
                    J. R. Technical Assoc. 
                    PO Box 5183
                    Belmont, CA 94002
                      or FAX to: (408) 978-1069
Limited Seating.  Register NOW to reserve your seat!  Your registration
will be CONFIRMED when payment is received. Payment due by 5 PM the
Friday before class.  Use our easy PayPal option, for credit cards,
or mail in your registration (CHECKS PREFERRED).

Registration for IEEE Members ($225):
Registration for Non-Members ($249):

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                         REGISTRATION FORM
  UNDERSTANDING IMAGING AND ANALYSIS OF THIN FILMS AND CONTAMINATION 
         Wednesday, September 26, 2001, Noon - 5 PM


IEEE #__________________ (required for discount)

NAME_____________________________________  COMPANY_________________________

ADDRESS____________________________________________________________________

CITY______________________________________STATE_______________ZIP__________

email___________________________    Include your FAX# for confirmation. 

Phone___________________________    FAX_______________________________

Manager's Name___________________ 

Payment by: Check #________ Amount $_________  Purchase Order #____________  

To Pre-register:  Phone us, or fill out the form and fax it.   C-92601
                         Include your FAX number, for confirmation.

              If you can't attend, what about a Team Member?

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