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In the test area, the emphasis is on completing the standards work of the Theta,jc measurement. Theta,jc is the limiting thermal resistance in determining how much power can be dissipated in an IC when an external heat sink is used. A key challenge has been to provide methods for measuring the case temperature accurately, while avoiding overly complicated or expensive instrumentation. The need for a robust standard in this area grows yearly as the power levels continue to increase.
He has authored or co-authored over 30 papers in the areas of thermal and electrical characterization of microelectronic packages, high-temperature superconductivity, electrical connectors, solid state physics, and fluid dynamics, and holds 5 patents.
He is the Chairman of the JEDEC JC-15.1 Committee, which sets industry standards for thermal testing and modeling. Dr. Guenin was recently General Chair of the 2001 Semi-Therm Conference. Additionally, he is an Associate Editor of Electronics Cooling Magazine.
Dr. Guenin received the B.S. degree in Physics from Loyola University, New Orleans, and the Ph.D. in Physics from the University of Virginia.
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