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OVERVIEW:

This presentation introduces digital microscope technology and its application in semiconductor development, failure analysis, and quality control. The integration of rapidly advancing digital image processing with slowly improving optical microscopy has advanced the use of microscopy as a tool for the component, process and packaging engineer. Bridging of the two technologies has allowed for unprecedented inspection and image analysis capabilities. Advanced optics and software algorithms produce high resolution images with near-infinite depth-of-field; SEM-like images are the result. Post-processing of captured images allows the user to change point of view and to make critical measurements, as well as inserting comments and arrows.

I plan on having the equipment with me to demonstrate after the presentation. I think that would give a much better understanding as to the capabilities of this type of equipment. I can also image samples for the attendees should they choose to bring some.

Speaker Biography

    Andrew Kominek is a Sales Executive and Applications Engineer with the Micro Analysis Group at Keyence Corporation. He received his B.S.E.E. from the University of Texas at Austin in 2006 and has been responsible for marketing and supporting the Keyence digital microscope in the Bay Area for the past two years. During that time he has worked with numerous companies spanning a variety of industries, including automotive, semiconductor, medical device, defense, and more recently, solar.
    His efforts have been a driving force in the penetration of the solar market and have resulted in nearly a threefold increase in sales to both medical device and semiconductor industries, with sales exceeding 2.5 million dollars over the past two years. He also secured the largest quantity microscope order in Keyence America history with one of the top semiconductor equipment suppliers in the world.