(Last year's presentation slides, links to talks: www.cpmt.org/scv/meetings/cpmt1410w.html). Check back around Oct. 30th for slides of this year's talks and links to the webcasts.

Please register in advance for this event, using our CPMT Chapter's EventBrite registration site.

You may register yourself, plus others from your company/institution, for either the on-site Workshop, or for the live Webinar broadcast. There is no cost.

PLEASE RESERVE IN ADVANCE -- through Oct. 12 (Monday)
• This is a FREE event, and includes lunch. There is no fee for attending.
• Advance registration required, and on-site seating may be limited. Unlimited Web participation.
  
• On-site registration: 8:30 AM - 9:00 AM. Workshop talks from 9:00 AM - 4:00 PM (PDT). Lunch from Noon - 1:00 PM
  
• On-line checkin: 8:30 AM PDT (1630 UTC) - 8:45 AM (1645 UTC), using your browser; links and login information will be provided in advance by email.
  
• Cost: none (includes equipment demos, light lunch, and drinks on-site) Location: On the campus of Juniper Networks:
  
  • 1194 N. Mathilda Ave, Sunnyvale CA (MAP)
  • Enter through lobby

  • Also broadcast LIVE on the Internet, via WebEx (same registration procedure)

  OVERVIEW:
  The Workshop talks are shown below.
  

  Speaker / Company	Title and Abstract of Talk
  8:30 AM - Registration opens
  8:45 AM - Indtroduction and Welcome Marc Hartranft, Juniper Networks
  9:00 AM - Pierre Maillard, Michael Hart, Jeff Barton, Praful Jain, and James Karp, Xilinx	Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA The single-event response of Xilinx 20nm UltraScale Kintex FPGA is characterized using neutron, 64 MeV proton, thermal neutron and alpha foil irradiation sources. Single-event upset and multi-bits upset results are presented.
  9:25 AM - Durwyn Dsilva, Microsemi	SEL and SEU Performance of Microsemi SmartFusion2 FPGAs Microsemi SmartFusion2 Flash-based reprogrammable SoC FPGAs are neutron-beam tested at Los Alamos National Laboratory (LANL). Results demonstrate the absence of Single-Event-Latchup (SEL) and configuration upsets in terrestrial and aviation background neutron environments. Single-Event-Upsets (SEUs) are also discussed for the Fabric FFs, Global Logic, and memory structures (uSRAM, LSRAM).
  9:50 AM - Mike Gordon, IBM	Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements The samples in an XIA Ultra-Lo 1800 ionization counter sit on the electrically grounded cathode, and reside within the active counter volume, electrically-insulating samples can distort the uniform electric field within the counter. This can lead to a reduction in the measured alpha particle emissivity of these samples. We will discuss how to quantify and mitigate such effects.
  10:15 AM - Morning coffee break
  10:30 AM - Bharat Bhuva, Venderbilt University	TBD (summary to be provided)
  10:55 AM - Mark Levinson, Los Alamos National Laboratory	Keynote: Sex, Lies and Particle Physics How a doctoral degree in theoretical particle physics ended up being the perfect preparation for a career in feature filmmaking.
  12:00 - 1:00 PM: Lunch, exhibits, posters
  1:00 PM - Norbert Seifert, Intel	Single Event Effects in the FinFET Era We report on radiation-induced soft error rate (SER) improvements in the 14nm 2nd generation Tri-Gate technology compared to devices manufactured in 22nm 1st generation Tri-Gate and 32nm planar technologies. Upset rates of memory devices, sequential elements and combinational logic were investigated for terrestrial radiation environments, including thermal and high energy neutrons, high energy protons, alpha-particles and muons.
  1:25 PM - Charlie Slayman, Cisco Systems	Updates on JEDEC JESD89 Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices The JESD89 standard was released in its original form in August 2001 and updated in October 2006. For the past year, a task group of soft error experts have been working on revisions to the standard based on new learning of terrestrial soft error and single event effect discovered over the past 9 years. This talk will cover updates to those changes under discussion.
  1:50 PM - Afternoon coffee break
  2:05 PM - Edward Priest, Juniper Networks	Inherent Soft Error Rate in Large System - Latest Changes (summary to be provided)
  2:30 PM - Paolo Rech, Federal University of Rio Grande do Sul (UFRGS)	The Reliability Issue in Actual and Future Supercomputers Modern supercomputers like TITAN at the Oak Ridge National Laboratory are composed of more than 18,000 GPUs that work in parallel. Scientists in the areas of astrophysics, fusion, climate, and combustion run large-scale simulations on these supercomputers which can take a long time and it is critical to mitigate the risk of system failures such as silent data corruptions (SDCs). These GPU cores are sensitive to radiation-induced errors, including those from the terrestrial neutron radiation environment. In this talk experimental data obtained in three years of radiation experiments on GPUs will be presented and discussed. A detailed analysis on the causes and effects of radiation-induced failures in supercomputers will be provided.
  2:55 PM - Paolo Privitera, University of Chicago	High Resistivity, Thick CCDs for Ultra-low Alpha Emissivity Measurements High resistivity, ~mm-thick CCDs - recently developed for the DAMIC experiment searching for Dark Matter particles – present unique capabilities as detectors for ultra-low alpha emissivity measurements: exceptionally low levels of radioactive contamination, unique particle identification thanks to their spatial resolution, and large detection area. I will describe recent measurements of ultra-low alpha emissivity which illustrate the potential of the CCD technique for this application.
  3:20 PM - Eric Crabill, Xilinx	Intro to Interactive Session New challenges; Automotive application considerations; other topics
  3:30 PM - Interactive Session (Host: Eric Crabill, Xilinx)	Session will be structured with pre-Workshop questions and input from the on-site audience.
  Closing at 4:15 PM