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Fifth Annual IEEE-SCV Soft Error Rate (SER) Workshop -- Call for Papers

    Thursday, October 24, 2013     10:30 AM (1730 UTC)

Chair: Peng Su, Ph.D., Component Quality and Technology Group, Cisco Systems, Inc.
Program Chairs: Shi-Jie Wen and Rick Wong, Cisco Systems, Inc.
Sponsored by: Cisco Systems, Inc.
      and the CPMT, Electron Devices, and Reliability chapters of IEEE, Santa Clara Valley

(Last year's presentation slides, links to talks:

The 5th annual IEEE Santa Clara Valley SER Workshop provides a unique forum for component manufacturers, assembly houses, and electronic system manufacturers to exchange innovative ideas and recent results on the measurement, monitoring, and control of alpha emission from packaging materials and manufacturing processes. Built on the success of our workshops held in 2009 through 2012 (with over 100 attendees), this year's event continues to cover a wide range of areas and subjects critical to the control and mitigation of device soft error rates. Talks will cover the newest updates and advances for a wide range of areas including alpha emissivity measurement techniques and processes and impact on advanced low-k devices. Speakers will come from equipment makers, component manufacturers, and academic institutions. Sign up early!

If you are not on our Chapter's regular email distribution list for meeting anouncements, you can easily be added! Place yourself on our email distribution list [or send a request to Paul Wesling.]

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