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Sixth Annual IEEE-SCV Soft Error Rate (SER) Workshop

    Thursday, October 16, 2014     Registration at 8:30 AM; Program from 9:00 AM - 3:30 PM PDT (1700 UTC - 2330 UTC)

Chair: Peng Su, Ph.D., Component Quality and Technology Group, Cisco Systems, Inc.
Program Chair: Mike Gordon, IBM
Technical Committee: Rick Wong and Charlie Slayman, Cisco Systems, Inc; Jehoda Refaeli, Freescale Semiconductor; Qiang Guan, Los Alamos National Laboratory
Sponsored by: Cisco Systems, Inc.
      and the CPMT, Electron Devices, and Reliability chapters of IEEE, Santa Clara Valley

You may now download all speakers' slides and view their presentations (plus presentations for the previous 3 years). See below for talk descriptions; visit our SER Workshop page to access the slides/talks, or download them below.


(Last year's presentation slides, links to talks: Check back around Oct. 30th for slides of the talks and links to the webcasts.

The 6th annual IEEE Santa Clara Valley SER Workshop provides a unique forum for component manufacturers, assembly houses, and electronic system manufacturers to exchange innovative ideas and recent results on the measurement, monitoring, and control of alpha emission from packaging materials and manufacturing processes. Built on the success of our workshops held in 2009 through 2013 (with over 100 attendees), this year's event continues to cover a wide range of areas and subjects critical to the control and mitigation of device soft error rates. Talks will cover the newest updates and advances for a wide range of areas including alpha emissivity measurement techniques and processes and impact on advanced low-k devices. Speakers will come from equipment makers, component manufacturers, and academic institutions. See details of speakers and talks below. Sign up early!

If you are not on our Chapter's regular email distribution list for meeting anouncements, you can easily be added! Place yourself on our email distribution list [or send a request to Paul Wesling.]

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